Team

Roger Artigas Pursals

Research Director
Master's degree in Physics from the Autonomous University of Barcelona. (1991-1996)

PhD degree in physics from the Politechnical University of Catalonia (1996-2001)

Currently working on the Optical Metrology area for technical surfaces. A Spin-off company of UPC was created in 2001, Sensofar Tech SL, where at the moment he holds the position of Vice President on Optical Metrology.
eMail
roger.artigas-pursals@upc.edu
Phone
93 739 89 06 / 89 10
Futur UPC
https://futur.upc.edu/RogerArtigasPursals
ORCID
0000-0002-6893-2934
Title
Optical engineering tasks required within the Misiones 2024 ASUMO project - Autonomy and Situational Awareness Architecture for UAS and Air Mobility
Study of the current state of measurement and calibration algorithms for fringe projection.
Study and implementation of advanced optical computational techniques applied to surface optical metrology systems
Study and development of optical technologies for measuring large area surfaces with nanometric resolution. Milestone 2: Design and manufacture of the second prototype, specification validation, testing and documentation transfer.
Study and development of ultra-fast optical sensors for three-dimensional surface metrology
Title

Autor: Martínez, P.. ESTUDI I DESENVOLUPAMENT DE SENSORS ÒPTICS ULTRA-RÀPIDS PER A METROLOGIA TRIDIMENSIONAL DE SUPERFÍCIES. 10/02/2023. Excel·lent Cum Laude. Direcció: Artigas, R.; Bermudez, C.. Universitat Politècnica de Catalunya. URL.

Autor: Bermudez, C.. Estudi i desenvolupament d'un nou sistema d'inspecció de stents basat en tècniques de metrologia òptica. 22/05/2017. Excel·lent Cum Laude. Direcció: Artigas, R.; Laguarta, F.. Universitat Politècnica de Catalunya. URL.

Autor: Cadevall, C.. New developments in optical suface profiling. 26/03/2007. Excel·lent Cum Laude. Direcció: Laguarta, F.; Artigas, R.. Universitat Politècnica de Catalunya.

Title

Zhukova, O.; Artigas, R.; Carles, G.. Computational self-corrected quantitative 3D topographic imaging. Scientific reports. 2025. Volum: 15. Número: 1. URL. DOI. JCR-Science Edition. FI: 3.9. Q1;

Martínez, P.; Bermúdez, C.; Artigas, R.; Carles, G.. Single-shot optical surface profiling using extended depth of field 3D microscopy. Optics express. 2022. Volum: 30. Número: 19. Pàgs: 34328~34328. URL. DOI. JCR-Science Edition. FI: 3.8. Q2;

Järvinen, H.; Kassamakov, I.; Viitala, T.; Bermúdez, C.; Artigas, R.; Martínez, P.. Step height standards based on self-assembly for 3D metrology of biological samples. Measurement science and technology. 2020. Volum: 31. Número: 9. Pàgs: 094008-1~094008-1. URL. DOI. JCR-Science Edition. FI: 2.046. Q3;

Bermudez, C.; Laguarta, F.; Cadevall, C.; Matilla, A.; Ibañez, S.; Artigas, R.. Stent optical inspection system calibration and performance. Applied optics. 2017. Volum: 56. Número: 9. Pàgs: 134~134. URL. DOI. JCR-Science Edition. FI: 1.791. Q3;

Florian, C.; Caballero, F.; Fernández, J.; Artigas, R.. Printing of silver conductive lines through laser-induced forward transfer. Applied surface science. 2016. Volum: 374. Pàgs: 265~265. URL. DOI. CiteScore. FI: 8.7.

Florian, C.; Caballero, F.; Fernández, J.; Artigas, R.. Conductive silver ink printing through the laser-induced forward transfer technique. Applied surface science. 2015. Volum: 336. Pàgs: 304~304. URL. DOI. CiteScore. FI: 8.7.

Pinto, A.; Laguarta, F.; Artigas, R.; Cadevall, C.. Testing and applicability of the UPC-ZEBRA interferometer as a phasing system in segmented mirror telescopes. Applied optics. 2004. Volum: 43. Número: 5. Pàgs: 1091~1091. JCR-Science Edition. FI: 1.799. Q2;

Laguarta, F.; Pinto, A.; Artigas, R.; Cadevall, C.. 09New interferometric technique for piston measurement in segmented mirros. Journal of optics A. Pure and applied optics. 2002. Volum: 4. Pàgs: S369~S369. JCR-Science Edition. FI: 1.274. Q2;

Laguarta, F.; Al-Khatib, I.; Artigas, R.. Laser profiler based on the degth focus principle. Journal of optics. Nouvelle revue d'optique. 1998. Volum: 29. Número: 3. Pàgs: 236~236. JCR-Science Edition. FI: 0.338. Q3;

Title

Zhukova, O.; Artigas, R.; Carles, G.. Mapping and correcting residual flatness errors in optical metrology for high precision surface measurements. SPIE Optical Metrology 2025.

Artigas, R.. Computational correction of scanner non-linearity in 3D microscopy. Optica Imaging Congress.

Artigas, R.. Suppression of scanning nonlinearities through computational self-correction in optical profilometry. - SPIE Photonics Europe 2024.

Zhukova, O.; Artigas, R.; Carles, G.. Computational self-correction of scanning nonlinearities in optical profilometry. SPIE Optical Metrology 2023. .

Martínez, P.; Bermúdez, C.; Artigas, R.. 3D optical sensor in continuous motion. Euspen‘s 22nd International Conference and Exhibition. .

Martínez, P.; Bermúdez, C.; Artigas, R.; Carles, G.. Extended depth of field microscopy for single shot 3D surface profiling. Applied Industrial Spectroscopy 2021.

Martínez, P.; Bermúdez, C.; Artigas, R.. High repetition rate 3D optical sensor. Euspen‘s 21th International Conference and Exhibition.

Martínez, P.; Bermúdez, C.; Carles, G.; Cadevall, C.; Matilla, A.; Mariné, J.; Artigas, R.. Metrological characterization of different methods for recovering the optically sectioned image by means of structured light. SPIE Optical Metrology 2021. .

Martínez, P.; Bermúdez, C.; Moya, M.; Artigas, R.. Small footprint high-speed optical 3D profiler. Euspen‘s 20th International Conference and Exhibition. .

Martínez, P.; Bermúdez, C.; Cadevall, C.; Matilla, A.; Artigas, R.. Three-dimensional imaging confocal profiler without in-plane scanning. Optics and Photonics for Advanced Dimensional Metrology 2020. .

Bermúdez, C.; Martínez, P.; Cadevall, C.; Artigas, R.. Active illumination focus variation. SPIE Optical Metrology 2019. .

Bermúdez, C.; Martínez, P.; Cadevall, C.; Artigas, R.. High-speed, roll to roll coherence scanning Interferometry in a laser texturing process. Euspen‘s 19th International Conference and Exhibition. .

Bermúdez, C.; Felgner, A.; Martínez, P.; Matilla, A.; Cadevall, C.; Artigas, R.. Residual flatness error correction in three-dimensional imaging confocal microscopes. Optical Micro- and Nanometrology VII. .

Bermúdez, C.; Artigas, R.; Martínez, P.; Kassamakov, I.. Round robin test on V-shape bio-imaging transfer standard for determination of the instrument transfer function of 3D optical profilers. Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV. .

Matilla, A.; Bermudez, C.; Mariné, J.; Martinez, D.; Cadevall, C.; Artigas, R.. Confocal unrolled areal measurements of cylindrical surfaces. SPIE Optical Metrology 2017. .

Bermúdez, C.; Laguarta, F.; Cadevall, C.; Matilla, A.; Ibañez, S.; Artigas, R.. Novel stent optical inspection system. Imaging and Applied Optics 2016. .

Matilla, A.; Mariné, J.; Perez, J.; Cadevall, C.; Artigas, R.. Three-dimensional measurements with a novel technique combination of confocal and focus variation with a simultaneous scan. Optical Micro- and Nanometrology VI. .

Diaz-Pinto, A.; Laguarta, F.; Artigas, R.; Cadevall, C.. Non-contact measurement of aspherical and freeform optics with a new confocal tracking profiler. SPIE Optical Systems Design 2011. .

Cadevall, C.; Oriach, C.; Artigas, R.; Pinto, A.; Laguarta, F.. Improving the measurement of thick and thin films with optical profiling techniques. Optical Measurement Systems for Industrial Inspection V. .

Oriach, C.; Laguarta, F.; Cadevall, C.; Artigas, R.; Pinto, A.. Deep 3D Optical Metrology. Focus on Microscopy 2007.

Laguarta, F.; Artigas, R.; Pinto, A.; Cadevall, C.; Oriach, C.. Innovando en Metrología Óptica de Superficies. Las contribuciones del CD6. VIII Reunión Nacional de Óptica.

Rominsky, F.; Wojt, A.; Novella, M.; Artigas, R.; Laguarta, F.; Cadevall, C.. 3D-shape and texture measurements on the micro and nano-scales using a new dual-technology optical sensor. 2nd International Symposium on Photonics in Measurement.

Laguarta, F.; Artigas, R.; Cadevall, C.. 3D-shape measurement of nozzles on the micrometric scale. Photonics Europe.

Artigas, R.; Laguarta, F.; Cadevall, C.. Dual-technology optical sensor head for 3D surface shape measurements on the micro and nano-scales. Photonics Europe.

Cadevall, C.; Artigas, R.; Laguarta, F.. Development of confocal-based techniques for shape measurements on structured surfaces containing dissimilar materials. Optical Metrology, Conference on Optical Measurement Systems for Industrial Inspection III.

Cadevall, C.; Artigas, R.; Laguarta, F.. Development of confocal-based techniques for shape measurements on structured surfaces containing dissimilar materials. SPIE Optical Metrology 2003. .

Pinto, A.; Laguarta, F.; Artigas, R.. New interferometric technique for piston measurements in segmented mirros. 3rd Topical Meeting on Optoelectronic Distance Measurement and Applications.

Laguarta, F.; Artigas, R.; Pinto, A.. Metrología 3D de superficies pulidas y rugosas mediante un nuevo perfilómetro confocal. 2º Congreso Español de Metrología.

Artigas, R.; Pinto, A.; Laguarta, F.. Three-dimensional micromeasurements on smooth and rough surfaces with a new confocal optical profiler. Euroopto symposium on industrial lasers and inspection/environsense..

Artigas, R.. THREE-DIMENSIONAL MICROMEASUREMENTS ON SMOOTH AND ROUGH SURFACES WITH A NEW CONFOCAL OPTICAL PROFILER. Euroopto symposium on industrial lasers and inspection/environsense..

Laguarta, F.; Artigas, R.; Pinto, A.. Micromeasurements on smooth surfaces with a new confocal optical profiler. SPIE INTERNATIONAL SYMPOSIUM ON INTELLIGENT SYSTEMS AND ADVANCED MANUFACTURING.

Al-Khatib, I.; Artigas, R.; Vega, F.; Armengol, J.; Lupon, N.; Laguarta, F.. Perfilómetro óptico confocal. V Reunión Nacional de Óptica.

Artigas, R.. PERFILÓMETRO ÓPTICO CONFOCAL. V Reunión Nacional de Óptica.

Title

Artigas, R.. DEVICE AND METHOD FOR OPTICALLY INSPECTING AND ANALYSING STENT-LIKE OBJECTS. Número de registre: WO2015/096874. Data de registre: 2013-12-23 00:00:00.0. País de registre: Espanya. Països d'explotació: Entitat titular: SENSOFAR-TECH, S.L..

Laguarta, F.; Artigas, R.. METHOD AND DEVICE FOR NON-CONTACT MEASURING SURFACES. Número de registre: PCTEP2011058281. Data de registre: 2011-05-20 00:00:00.0. País de registre: Espanya. Països d'explotació: Entitat titular: Universitat Politècnica de Catalunya.

Laguarta, F.; Artigas, R.; Cadevall, C.. Optical metrology method for determining the three-dimensional topography of an orifice and apparatus for determining three-dimensional topographies according to said method. Número de registre: PCT 3075-4. Data de registre: 2004-10-08 00:00:00.0. País de registre: Espanya. Àmbit: internacional. Països d'explotació: Entitat titular: UPC.

Artigas, R.; Laguarta, F.; Cadevall, C.. Perfilómetro óptico de tecnología dual (Confocal e Interferométrica) para la inspección y medición tridimensional de superficies. Número de registre: P200401071. Data de registre: 2004-04-23 00:00:00.0. País de registre: Espanya. Àmbit: estatal. Països d'explotació: Entitat titular: UPC.

Laguarta, F.; Artigas, R.; Cadevall, C.. Procedimiento de metrologia óptica para la determinación de la topografía tridimensional de un orificio. Número de registre: P200302355. Data de registre: 2003-10-10 00:00:00.0. País de registre: Espanya. Àmbit: estatal. Països d'explotació: Entitat titular: UPC.