Centre for Sensors, Instruments and Systems Development
Universitat Politècnica de Catalunya
Shaping light to your needs
Thin Film Reflectometry System
Name
Thin Film Reflectometry SystemBrand
MICROPACKModel
NANOCALC-UV-VIS-NIRDescription
Equipment that allows thin layers thickness measurements in the range 10nm – 40mm, with a resolution of 0.1 nm, using white light projection through an optical fiber and observing its reflection through a spectrometer. Measurements of up to 4 stacked layers and non-contact surface profilometry can be performed, with nanometric resolution.
Extranet
CD6 Centre for Sensors, Instruments and Systems Development
Rambla de Sant Nebridi, 10 · 08222 · Terrassa (Barcelona)
Rambla de Sant Nebridi, 10 · 08222 · Terrassa (Barcelona)
