Centro de Desarrollo de Sensores, Instrumentación y Sistemas
Universitat Politècnica de Catalunya
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Congresos
Cristina Cadevall Artigues
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Bermúdez, C., Laguarta, F., Cadevall, C., Matilla, A., Ibáñez, S., Artigas, R. (2016): "Novel stent optical inspection system".Applied Industrial Optics: Spectroscopy, Imaging and Metrology 2016. Heidelberg Germany. 25–28 July 2016
Matilla, A.; Mariné, J.; Perez, J.; Cadevall, C.; Artigas, R.(2016):"Three-dimensional measurements with a novel technique combination of confocal and focus variation with a simultaneous scan." Optical Micro-and Nanometrology VI: 5-7 April 2016, Brussels, Belgium
Andrés Arasanz, Niels Schwarz, Aitor Matilla, Jordi Mariné. Cristina
Cadevall, Roger Artigas (2014):"Using optical areal measurement methods to assess the surface shape and texture on aluminium anodized surfaces." Aluminum Andoizers Council Conference & Exposition September16-18. Pittsburg, Pennsylvania,USA.
Pinto, A., Laguarta, F., Artigas, R. and Cadevall, C.(2011): Non-contact measurement of aspherical and freeform optics with a new confocal tracking profiler”, SPIE Optical Systems Design, Marseille. Del 5 al 8 de Setembre de 2011
Pinto, A., Cadevall, C. Artigas, R., Laguarta, F. (2011): "Non-contact measurement of aspherical and free-form optics with a new confocal tracking profiler". Del 23 al 26 de maig - EOS Conference on Manufacturing of Optical Components (EOSMOC)
Oriach, C., Laguarta, F., Cadevall, C., Artigas, R., Pintó, A. (2008): "Adaptative Optics Applied to Deep 3D Metrology". Focus on Microscopy (FOM08). Comunicació Oral. Osaka, Japan
Cadevall, C., Oriach, C., Artigas, R., Pintó, A., Laguarta, F. (2007): "Improving the measurement of thick and thin films with optical profiling techniques". SPIE, Vol. 6616
Oriach, C.,Laguarta, F., Cadevall, C., Artigas, R. and Pintó, A.(2007): "Deep 3D Optical Metrology". Comunicació Oral. Focus on Microscopy (FOM07)
Pladellorens, J., Pintó, A., Segura, J., Cadevall, C., Antó, J., Pujol, J., Vilaseca, M., Coll, J. (09/2006): "Dispositivo para la medida del color y manchas de la piel."
Laguarta, F.,Artigas,R.,Pintó, A., Cadevall, C., Oriach, C. (09/2006): "Innovando en Metrología Óptica de Superficies. Las Contribuciones del CD6."
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CD6 Centro de Desarrollo de Sensores, Instrumentación y Sistemas
Rambla de Sant Nebridi, 10 · 08222 · Terrassa (Barcelona)
Rambla de Sant Nebridi, 10 · 08222 · Terrassa (Barcelona)