Centro de Desarrollo de Sensores, Instrumentación y Sistemas
Universitat Politècnica de Catalunya
Shaping light to your needs
Patentes
Roger Artigas Pursals
volver
Dual (Confocal and Interferometric) Technology Optical Profilometer.
Optical metrology method for determining the three-dimensional topography of an orifice.
Method and device for non-contact measuring surfaces.
Device and method for optically inspecting and analysing stent-like objects
Extranet
CD6 Centro de Desarrollo de Sensores, Instrumentación y Sistemas
Rambla de Sant Nebridi, 10 · 08222 · Terrassa (Barcelona)
Rambla de Sant Nebridi, 10 · 08222 · Terrassa (Barcelona)