Centre for Sensors, Instruments and Systems Development

Universitat Politècnica de Catalunya

Shaping light to your needs

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Congresses

Luque, S., Díaz-Douton, F., Arjona, M., Pujol, J. (2003) "Medidas de la calidad óptica del ojo humano por medio de la técnica del doble paso". Publicación: Actas del Congreso

Vilaseca, M., Pujol, J., Arjona, M., Martínez-Verdú, F.M. (2003) "Illuminant influence on the reconstruction of NIR spectra". IS&T's 2003 PICS Conference. May 13-16, 2003. The Hyatt Regency Hotel, Rochester, New York. Publicación: Proceedings

Pujol, J., Benito, A., Díaz-Douton, F., Arjona, M., Güell, J.L., Artal, P. (2003) "Estimating retinal image quality: Double-pass provides information where wavefront sensors might fail". Publicación: Actas del Congreso

Pujol, J., Martínez-Verdú, F.M., Capilla, P. (2003) "Estimation of the device gamut of a digital camera in raw performance using a optimal color-stimuli". Publicación: Proceedings.

Martínez-Verdú, F.M., Pujol, J., Capilla, P. (2003) "Testing the reciprocity law in digital photography" Publicación: Proceedings

Artal, P., Benito, A., Díaz-Douton, F., Pujol, J., Arjona, M., Güell, J.L. (2003) "Retinal image quality beyond aberrometry".

Martínez-Verdú, F.M., Pujol, J., Vilaseca, M., Capilla, P. (2003): "Characterization of a digital camera as an absolute tristimulus colorimeter". SPIE Proceedings 5008 (IS&T/SPIE) 15th Annual Symposium Electronic Imaging: Machine Vision Applications in Industrial Inspection XI (EI 2003). Santa Clara, California, USA

Cadevall, C., Artigas, R. and Laguarta, F. (2003) "Development of confocal-based techniques for shape measurements on structured surfaces containing dissimilar materials." Optical Metrology. Comunicación Oral. Munich (Alemania)

Laguarta, F. (2003) "3D-shape measurement on the micro and nano-scales using enhanced depth-resolution confocal imaging techniques". EMBO Workshop on Advanced Light Microscopy, 3rd International Meeting of ELMI (European Light Microscopy Initiative). Conferencia Invitada. Congreso: EMBO Workshop on Advanced Light Microscopy, 3rd International Meeting of ELMI (European Light Microscopy Initiative) Publicación: EMBO

Vilaseca, M., Pujol, J., Arjona, M. (2003) "NIR spectrophotometric system based on a conventional CCD camera". SPIE Proceedings 5011 (IS&T/SPIE 15th Annual Symposium Electronic Imaging: Machine Vision Applications in Industrial Inspection XI (EI 2003)). Santa Clara, California, USA.

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CD6 Centre for Sensors, Instruments and Systems Development
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