Centre for Sensors, Instruments and Systems Development

Universitat Politècnica de Catalunya

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Congresses

Cifuentes, A., Arasa, J., Pizarro, C. (4-8/06-06): "Forward tracing technique for diffraction analysis of apertures in optical systems".

Pizarro, C., Díaz, J.A. (4-8/06-06): "Merit Function Segmentation Dependence on the Isoplanatic Patch criterion".

Vilaseca, M., de Lasarte, M., Pujol, J., Arjona, M., Imai, F. H.: "Estimation of Human Iris Spectral Reflectance Using a Multi-Spectral Imaging System". Third European Conference on Color in Graphics, Imaging and Vision (CGIV´06). Leeds, UK. Juny 2006

De Lasarte, Marta, Arjona, M., Vilaseca, M., Pujol, J.: "Development of an Optimized Flat-field Correction Algorithm for Digital Cameras." Third European Conference on Color in Graphics, Imaging and Vision (CGIV´06). Leeds, UK. Juny 2006

Pujol, J., De Lasarte, M., Vilaseca, M., Arjona, M.: "High Dynamic Range Multispectral System for Wide Color Gamut Measurements." European Conference on Color in Graphics, Imaging and Vision (CGIV´06). Leeds, UK. June 2006

Díaz-Douton, F., Luque, S.O., Lapuente, V., Arjona, M., Pujol, J., Sanabria, F. (05/2006): "Estimating ocular aberrations with the curvature sensing technique: comparison with the Hartmann-Shack method".

Luque, S.O., Díaz-Douton, F., Lapuente, V., Pujol, J., Arjona, M., Artal, P. (05/2006): "Estimating Intraocular Scattering from Combined Hartmann-Shack and Double-pass Measurements"

Issolio, L., Colombo, E, Gispets, J., Pujol, J., Luque, S.O. (05/2006): Toward a Clinical Measurement of the Performance of Contact lenses under Glare conditions".

Güell, J.L., Manero, F., Sisquella, M., Ondategui, J.C., Pujol, J., Arjona, M. (05/2006): "Presbyopic profile with the MEL 80. Preliminary experience."

De Lasarte, M., Vilaseca, M., Pujol, J., Arjona, M.: "Color measurements with colorimetric and multispectral imaging systems".Electronic Imaging- Spectral Imaging: Eight International Symposium on Multispectral Color Science. San José (California). 2006.

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CD6 Centre for Sensors, Instruments and Systems Development
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