Patents

Roger Artigas Pursals

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Dual (Confocal and Interferometric) Technology Optical Profilometer.

Optical metrology method for determining the three-dimensional topography of an orifice.

Method and device for non-contact measuring surfaces.

Device and method for optically inspecting and analysing stent-like objects

Extranet

CD6 Centre for Sensors, Instruments and Systems Development
Rambla de Sant Nebridi, 10 · 08222 · Terrassa (Barcelona)