Centre for Sensors, Instruments and Systems Development

Universitat Politècnica de Catalunya

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Atomic Force Microsocope (AFM)

Name

Atomic Force Microsocope (AFM)

Brand

NANOSURF

Model

NANOSURF MOBILE

Description

Equipment that provides three-dimensional images of solid surfaces with high resolution. Based on the local interaction between a tip and the surface to be observed. It is suitable for the characterization of materials. It can work in two modes of operation: Contact and Tapping (without contact) with resolutions up to 5 nm in XY and 1 mm in Z. The tracking ranges are 100 x 100 mm in XY and 10 mm in Z.

Extranet
CD6 Centre for Sensors, Instruments and Systems Development
Rambla de Sant Nebridi, 10  ·  08222  ·  Terrassa (Barcelona)